Introduction to atom probe tomography: opportunities and performance of the new EIKOS instrument
Time: Thu 2021-12-09 09.15 - 10.00
Location: FB42 and Zoom (link to zoom-meeting below the abstract)
Participating: Alexander Dahlström, Hultgren Laboratory, Dept. Materials Science and Engineering, ITM School
Atom probe tomography (APT) is a burgeoning microscopy and microanalysis technique, stemming from field-ion microscopy (FIM) with the addition of a time-of-flight mass spectrometer. This allows for 3D compositional mapping of solid materials with sub-nanometer spatial resolution and chemical sensitivity in the range of tens of parts-per-million across all elements. With the addition of a UV laser, non-conductive samples can be analysed with a high yield as well. This technological breakthrough has enabled APT to reach a widespread application range and it is today a critical characterization technique for numerous materials such as metals, thin films, semiconductors, ceramics, and geological samples.
This talk will cover the basics of the technique, introduce the fundamental principles that enable the analysis but also limit the technique’s performance. I will showcase examples of applications to the compositional analyses of a range of micro-and nanostructural features, in relation to the host materials’ macroscopic physical properties.
A new instrument was introduced in 2019 using a novel integrated local electrode (ILE) design, called the EIKOSTM system. The EIKOSTM instrument is a refined, easier-to-use APT instrument tailored towards research and development at a reduced cost of ownership. The Hultgren Laboratory has recently secured the funds to acquire a high-performance EIKOS-UV instrument to be installed at KTH during 2022.