X-ray optics and nano imaging research

Senior scientist(s): Ulrich Vogt

X-ray imaging with x-ray nanobeams [1] is one of the most rapidly developing areas at synchrotron radiation and x-ray free-electron laser facilities around the world. Exciting applications of these nanobeams, i.e., x-ray radiation focused to very small spot sizes in the 10 – 100 nm range, can be found in many fields of science. The unique quality of x-ray nanobeam imaging is the opportunity for direct in-situ and in-operandi experiments exploring very challenging physical environments and giving direct correlation between structure and physical properties.

We design and manufacture diffractive zone plate optics (cf. Fig. 1) with diffraction-limited resolution in the 10 – 100 nm range [2, 3] for nanobeam imaging in the soft and hard x-ray range. Together with partners from Lund University we build the NanoMAX beamline and novel x-ray microscopes at the new Swedish synchrotron source MAX IV. The long term goals are x-ray imaging and diffraction experiments on the 10 nm resolution level. In the past, we investigated the applicability of diffractive zone plates at hard x-ray free electron laser sources [4].


  1. See, e.g., G. E. Ice, J. D. Budai, J. W. L. Pang,  Science 334, 1234-1239 (2011).
  2. J. Reinspach, F. Uhlén, H. M. Hertz and A. Holmberg, J. Vac. Sci. Technol. B, 29, 06FG02-1 (2011).
  3. F. Uhlén, D. Nilsson, J. Rahomäki, L. Belova, C. G. Schroer, F. Seiboth, A. Holmberg, H. M. Hertz and U. Vogt, Microel. Eng. 116, 40-43 (2014).
  4. F. Uhlén, D. Nilsson, A. Holmberg, H. M. Hertz, C. G. Schroer, F. Seiboth, J. Patommel, V. Meier, R. Hoppe, A. Schropp, H. J Lee, B. Nagler, E. Galtier, J. Krzywinski, H. Sinn and U. Vogt, Opt. Express 21, 8051-8061 (2013).
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